Course Description
Course Description
7050 - Microelectronic Testing and Design for Test
Course Code:
ELEC ENG 7050
Course Title
Microelectronic Testing and Design for Test
Academic Year:
2008
Semester:
2
Units:
3
Lecturer:
Dr A. Osseiran
E-mail Address:
a.osseiran@ecu.edu.au
Aims:
The aims of the course are to introduce
• the principles of digital and mixed signal semiconductor testing and Design
for Test
• the advanced techniques of testing such as embedded core testing and mixed-
signal Built-In Self-Test.
Outcomes:
On completion of this course students should be able to:
• place the test at the start of the design process;
• recognise the failure mechanisms and their fault models;
• distinguish between test and verification;
• anticipate the manufacturing test issues of a new design;
• include a test strategy in a design;
• envisage the modification of an existing design to make it better testable;
• develop new test strategies for digital or mixed-signal circuits or systems.
Previous Studies:
A reasonable understanding of the VLSI and integrated electronic systems is required.
Delivery Methods:
Teaching will be conducted in September in 5-day duration. Five lecture topics are
devoted to basic testing and techniques and five topics cover the advanced testing.
Assessment:
There will be two tests of 120 mins each during the September teaching weeks. Each
test contributes to 10% of final mark.
Exam to be held in November, contributing 80%.
Course Outline:
Basic test approaches. Economics and role of testing.
Fundamentals of Automatic Test Equipment.
Defects in CMOS technology, fault models and fault simulation.
Automatic Test Pattern Generation.
Parametric testing, functional & structural tests.
Ad-hoc Design for Test rules.
Boundary-scan test for systems and boards.
Scan Path Testing Techniques.
Logic Built-In Self Test and data compaction techniques to reduce test time for digital
circuits.
Mixed-signal system and board testing and the analog boundary-scan test approach.
Modelling of the analog faults for the semiconductor manufacturing.
Mixed-signal testing using automatic test equipment and techniques for reducing the
test complexity.
Testing A/D and D/A using DSP, waveform generators and digitisers.
Reference Books
Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen: VLSI Test Principles and
Architectures (Design for Testability). (ISBN: 0-12-370597-5)
http://www.elsevier.com/wps/find/bookdescription.cws_home/707926/descrip
Keith B. Schaub and Joe Kelly: Production Testing of RF and System-on-a-Chip
Devices for Wireless Communications. (ISBN 1-58053-692-1)
http://www.artechhouse.com/default.asp?Frame=Book.asp&Book=1-58053-692-1
Michael L. J. Bushnell, Vishwani D. Agrawal (2000), Essentials of Electronic Testing
for Digital, Memory, and Mixed-Signal VLSI Circuits, Boston, Kluwer Academic
Publishers
Parag K. Lala (1997), Digital Circuit Testing and Testability, New York, Elsevier
Science and Technology Books
Alfred L. Crouch (1999), Design-For-Test For Digital IC's and Embedded Core
Systems, New Jersey, Pearson Education, Prentice Hall Modern Semiconductor
Design Series
Manoj Sachdev (1999), Defect Oriented Testing for CMOS Analog and Digital
Circuits, Boston, Kluwer Academic Publishers, Frontiers in Electronic Testing Series
IEEE Design & Test of Computers, IEEE Computer Society , http://computer.org/dt
Graduate Attributes
GA1
An advanced level of knowledge and understanding of the theory and
practice of Electrical and Electronic, Computer Systems or IT&T
Engineering and the fundamentals of science and mathematics that underpin
these disciplines.
GA3
The ability to apply knowledge in a systematic and creative fashion to the
solution of practical problems.
GA7
An ability to identify, formalise, model and analyse problems.
GA8
The capacity to design, optimise, implement, test and evaluate solutions.
GA9
An ability to plan, manage and implement solutions that balance
considerations of economy, quality, timeliness and reliability as well as
social, legal and environmental issues.
GA10
Personal attributes including: perseverance in the face of difficulties;
initiative in identifying problems or opportunities; resourcefulness in
seeking solutions; and a capacity for critical thought.
GA11
Skills in the use of advanced technology, including an ability to build
software to study and solve a range of problems.
GA13
An ability to utilise a systems approach to design and operational
performance.
These programs also foster the graduate attributes of the University of Adelaide and
the Institution of Engineers Australia. These should be read in conjunction with the
list above.
Assessment of Graduate Attributes
The examination will assess attributes GA1, GA7, GA8, GA11 and GA13. The tests
and tutorials are designed to develop and assess GA1, GA3, GA7, GA8, GA9, GA10,
GA11 and GA13.
